Industrial environments demand rugged and reliable solutions regardless of the type of system to be deployed. Electronics as a group are some of the most mechanically and performance fragile systems that live on the shop floor. Within this environment there are frequent examples of noise and interference sources that disturb or otherwise impair the reliable functioning of electronics. More and more, wireless sensors and metrology instruments are being deployed in production areas. Wireless systems deliver their quality or production data to critical operations downstream and are crucial components of the modern production reality. With this said, wireless data transmission of data is critically needed and simultaneously vulnerable to shop induced interference.

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For a long time surface metrology has been based upon measurement using 2D profilometers. Over the past twenty years the appearance of 3D profilometers and non-contact gauges has created a need for the standardization and formalization of the analysis of 3D surface texture. This paper presents the current status of the standardization process and includes a short description of the tools and parameters that will become available to users when work on the definition of the new standards, which is being carried out by working groups WG15 and WG16 of ISO technical committee TC213, has been completed.

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