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Check out the August 2013 edition of Quality Magazine for features about Test & Inspection, Software and Management.
Monte Carlo simulations, named for the city in Monaco, were developed during the 1940s with the Manhattan Project.
According to Smith, lean is not just for manufacturing but it is a philosophy that can be applied to any environment to reduce waste.
In some instances, optical inspection can refer to human visual inspection of an object, but these days it more likely refers to Automated Optical Inspection (AOI) conducted by a machine vision system or specialized AOI system.
Process maps and flowcharts are essential for your QMS. However, these tools are mistaken for the same tool and used interchangeably.
There is an interesting exercise you might come across if you ever happen to find yourself engaged in an ethical debate over responsibility or blame.
In metrology we have similar benign bits of hardware that can create havoc if misapplied, but in the grand scheme of things rarely are.
A defect happens when the outcome of any process, whether to manufacture a product or provide a service, does not produce the expected outcome.
Suppose a company wants to expand into a foreign market or combine its product with that of another firm. One of the quickest and most effective ways to accomplish this is through a strategic alliance or joint venture (JV) with another business.
Olympus announces the release of the LEXT OLS4100 laser confocal microscope system.
Wenzel America Ltd.’s new series of improvements in their line of coordinate measuring machines, the manual X-Cite CMM System, has been overhauled with new hardware and a sleek new look that is guaranteed to impress those who are seeking a reliable CMM.
CyberMetrics’ Asset Management Division (AMD) announced the release of FaciliWorks Desktop CMMS maintenance management software version 8.6 in both English and Spanish.
Hexagon Metrology’s Optiv® Classic 443 tp, the newest model in the Optiv Classic series, comes touch probe-ready and includes a high-resolution CCD (charge-coupled device) camera for multi-sensor applications with micro- to nano-scale precision measurement requirements.
Hexagon Metrology’s Leica Absolute Tracker AT402, an ultra-portable 3-D Absolute Tracker, can be utilized for fully guided 3-D measurement processes, as well as traditional inspection tasks.
Keyence Corporation has released a new multipurpose microscope.
Mitutoyo introduced the new Surftest Probe and SurfPak-SP software allowing surface roughness analysis on a Mitutoyo CNC CMM and eliminating the need for workpiece changeover to a second measurement device.
Spectra-Physics®, a Newport Corporation brand, introduces Spirit™-OPA, an automated optical parametric amplifier (OPA) specifically optimized for use with Spectra-Physics’ Spirit high-repetition-rate ultrafast laser.
Leica Microsystems has launched two cameras for routine brightfield or fluorescence applications.