Olympus announces the release of the LEXT OLS4100 laser confocal microscope system. Designed to deliver nanometer-level imaging, accurate 3D measurement, and outstanding surface roughness analysis, the OLS4100 features auto brightness and a new high-speed stitching mode.  

Engineered to meet a growing demand for increased measurement precision and wider observation applicability, the OLS4100 offers advanced measurement performance at ten-nanometer resolution with a variety of user-friendly performance parameters. Thanks to high numerical apertures and a dedicated optical system that obtains maximum performance from a 405 nm laser, the OLS4100 can reliably measure acute-angled samples that were previously impossible to measure.