Zeiss’ new Crossbeam series features include high speed in materials analysis and processing and its wide diversity of applications. Time intensive 3-D experiments that used to run for several days can now be completed overnight.

The newly developed focused ion beam (FIB) column enables fast and precise materials processing that can be observed with the field emission scanning electron microscope in real-time. High resolution over the entire voltage and current range allows users to work quickly and precisely. Designed for stability, the system ensures reproducible results even in long-term experiments. The field of application is expanded by the optionally available Massive Ablation Laser that rapidly prepares samples to access deeply buried regions of interest. Crossbeam is suitable for use in both materials and life sciences. Materials scientists benefit from the excellent 3-D analytics, the ability to image magnetic and non-conductive specimens with maximum resolution, and from the unique materials contrasts.

In combination with a Zeiss Xradia X-ray microscope (XRM), Crossbeam offers the possibility of complete specimen analysis across several orders of magnitude. The X-ray microscope first provides a 3-D image of the specimen without destroying it before the identified areas of interest are processed with the focused ion beam and analyzed with the electron beam.

The Carl Zeiss Group