With so many metrology and quality inspection methods to choose from which technology will do what job is often a mystery for manufacturers - small and large. 

To precisely and accurately answer these questions, we created the first apples to apples comparison of the top seven metrology methods in use today: a touch-trigger CMM, a tactile-scanning CMM, a 5-axis scanning CMM, white light inspection, laser scanning, high-speed scanning, and CT inspection. 

Working in conjunction with 3D printing experts at Fisher/Unitech, our Wenzel America engineers developed a part with all the major measuring challenges faced by manufacturers - including an air foil, freeform, prismatic and internal features.

This whitepaper not only compares the seven major inspection methods mentioned, it also shows side-by-side analysis of the costs for software and hardware, ease of use, data collection speed, and overall accuracy as well as relative strengths when used in production, reverse engineering, product development, and small or large part measurement.

Use this as your guide to finding the right metrology tool for the exact application or inspection process you need. We’ve also included a useful one-page Technology Scorecard for easy reference after you’ve read the full paper. This concise guide contains all the data you need to make an intelligent and informed decision before developing a quality inspection process or purchasing your next piece of measurement equipment.

Wenzel America, Ltd.

28700 Beck Rd. Wixom, MI 48393

Phone: 248.295.4300

Fax: 248.773.7565

[email protected]

 http://wenzelamerica.com/

To download the paper, click here.