In a sense, the XYZ inline inspection systems from SMAC Inc. (Carlsbad, CA) work as a mini-coordinate measuring machine (CMM) for inline inspection, says Steve Curtiss, applications manager at SMAC Inc.
As President, what do John McCain and Barack Obama propose to help boost manufacturing employment in the United States? And, going hand in hand, where does each nominee stand on the issue of trade?
Management invests time and money in Six Sigma to get better results. Projects are the key to organization improvement in Six Sigma; they also are the most visible and quantifiable part of this effort. Too often, organizations do not do the basics of good project selection and project management well.
These days the requirements for coordinate measuring machine (CMM) metrology devices have expanded well beyond touch-probe inspection using automated CMMs. In addition to an array of devices, there also are numerous applications such as reverse engineering, hard-probing, noncontact scanning, laser tracking and digital tool building, using both portable and stationary types of devices.
Intelligent sensors with integrated digital signal processing have become prevalent in an increasing number of applications. As the considerable gain in interference immunity, repeatability, durability and reliability of the gages does not involve any price increase, it is merely a matter of time before digital also will dominate in the field of coating thickness measurement.
Critical dimensions in semiconductor manufacturing are in the deep sub-micron and nanometer range. Over time, specialized measurement systems suitable for these dimensions have been developed with the necessary accuracy and resolution for process control.
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