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Home » Authors » Jeff Bibee

Jeff Bibee

Jeff Bibee is a sales manager at Werth Inc. (Old Saybrook, CT). For more information, call (860) 399-244, email [email protected] or visit www.werthinc.com.

Articles

ARTICLES

Multi-Sensor Metrology with X-ray Computed Tomography

X-ray computed tomography is an appropriate technology for complete acquisition of components without part preparation or destruction.
Jeff Bibee
June 9, 2015

Inspection is a critical element of any product development. In addition to dimensional inspection, evaluating products increasingly involves the inspection of free-form surfaces that are not relevant to the function.


Read More

Multi-Sensor Metrology with X-ray Computed Tomography

X-ray computed tomography is an appropriate technology for complete acquisition of components without part preparation or destruction.
Jeff Bibee
June 4, 2014

Inspection is a critical element of any product development. In addition to dimensional inspection, evaluating products increasingly involves the inspection of free-form surfaces that are not relevant to the function.


Read More

Quality 101: X-Ray Tomography--the Basics

Jeff Bibee
March 1, 2011
By building on the technology that was developed for optical and multisensor measurement, it is now possible to incorporate X-ray as a sensor for precision measurement.
Read More

The CT Solution

Jeff Bibee Ralf Christoph
September 29, 2008
Measure precisely and traceably using X-ray computed tomography.
Read More

QUALITY MEASUREMENT: Measure Completely and Accurately

Jeff Bibee
December 1, 2006
Inspection is a critical element of any quality program. In addition to the dimensional inspection of workpiece functional elements-typically with tight tolerances-evaluating products increasingly involves the inspection of free-form surfaces that are not relevant to the function.
Read More
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