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Understanding the terminology will help

determine what is digital and what is not.

LK will promote Metris' range of laser scanners, including the new Metris XC50 Cross Scanner and reverse engineering software.

The conversion of machined parts to powdered metal and cast parts comes at the same time that manufacturers face almost no-tolerance for defects and demand for high throughput

R/D Tech recently released its Ultrasound Phased-Array Transducer Catalog (2004-2005 edition) for the nondestructive testing market.

Members of NASA's Space Flight Leadership Council, which is charged with the oversight of the agency's Return to Flight efforts, has set a target window for the next flight of the Space Shuttle to no earlier than March 2005.

JEOL USA Inc., a supplier of electron microscopes and analytical instruments, named Dr. Thomas Isabell assistant product manager for the company's line of transmission electron microscopes (TEMs).

Innovations in magnetic particle inspection are driven by customer demands

Replication materials enable high resolution metrology on hard-to-measure surfaces.

A recent report from the Institute for Supply Management seems to bear out the idea that factory productivity is continuing to increase, for the ninth straight month, despite a limited hiring of workers.