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Home » Topics » Channels » NDT

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National Instruments Celebrates 30th Anniversary

April 24, 2006
AUSTIN, TX-The year 2006 marks two major milestones for National Instru-ments, including its 30th year since inception and 20th year since the creation of NI LabVIEW, the company’s flagship graphical programming software.
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NDT Labs Make Advances

Daniel W. Bosserman
April 24, 2006
By far the biggest and most consistent users of NDT inspection have been the military and the aerospace industry, closely followed by manufacturers and users of pipelines and pressure vessels. In the past, general industry has not been as aware of the need for such inspection, especially the advantages of using independent NDT lab services.
Read More

Resonant Acoustic Method Simplifies Metal Component Part Inspection

February 23, 2006
CINCINNATI-The Modal Shop Inc. announces a complete solution for 100% inspection of metal component part quality that simplifies decision making and lowers the risk of trying NDT-RAM. The program consists of an initial, free-parts test to determine feasibility of the NDT-RAM system for a specific part, a financial justification study to help justify the investment in NDT-RAM and complete system rentals so NDT-RAM can be tried in the production environment prior to purchase.
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Rice University Names 2005 Outstanding Young Engineering Alumnus

February 23, 2006
HOUSTON-Rice University has honored Tim Dehne, National Instruments (NI) senior vice president of research and development, with its 2005 Outstanding Young Engineering Alumnus award. The Rice Engineering Alumni group chose Dehne based on accomplishments in engineering and business, and service to Rice and the community at large.
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Cognex Announces UID Compliant Verifier

February 23, 2006
NATICK, MA-Cognex Corp. has introduced the Cognex Direct Part Mark (DPM) Verifier that enables DoD suppliers to meet new government requirements for unique identification (UID) of parts. The DPM Verifier is a complete system that ensures 2-D Machine Readable Information (MRI) complies with MIL STD 130 L Change 1 criteria for mark quality, and that the data is correctly encoded in the mark.
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Aspectrics Receives its Fifth U.S. Patent

February 23, 2006
PLEASANTON, CA-Aspectrics Inc., a supplier of encoded photometric infrared spectroscopy (EP-IR) analyzers, has received its fifth U.S. patent for its encoded photometric infrared spectroscopy disk technology and associated optics.
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ASAME Technology Obtains Exclusive Distribution License

February 23, 2006
CEDAR PARK, TX-ASAME Technology LLC holds an exclusive license to market, distribute and support the patented Automated Surface Strain Analysis and Measurement Environment (ASAME). ASAME Technology sells and supports the ASAME Target Model and the Grid Pattern Analyzer (GPA). Currently there are more than 100 ASAME and GPA users around the world.
Read More

NDT Applications: Eddy Current Testing Improves Thread Inspection with Automation

February 23, 2006
A custom eddy current testing (ECT) inspection system engineered by Zetec (Snoqualmie, WA) for automotive hub and spindle manufacturer Delphi Chassis (Troy, MI) has provided a fast and 100% reliable test method for thread inspection so cost-effective that it paid for itself in less than a year.
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National Instruments Acquires Iotech

February 23, 2006
AUSTIN, TX-National Instruments has acquired the operating assets of IOtech Inc. (Cleveland, OH), a provider of PC-based data acquisition and instrumentation products. Terms of the acquisition were not disclosed.
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Magnetic Particle Inspection Gets Revitalized

Paul Dunnwald
February 23, 2006
The difficulty with processing ring-shaped parts for aerospace applications is a risk of deformation, or burning or arcing of the part when clamped between contact plates. Correct part processing requires the part to be clamped twice, thus doubling the risk. The part must be turned 90 degrees between the two shots in order to inspect the area that comes in contact with the clamps because an indication may not develop in this area.
Read More
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