Aerotech’s ANT-L-Z crossed-roller, Z-axis, nanopositioning stages combine speed, accuracy, resolution, repeatability, reliability and size. They are offered in two models (ANT95-L-Z and ANT130-L-Z) and two accuracy grades.
The new materials microscope Leica DM2700 M from Leica Microsystems is ideal for all kinds of routine inspection tasks in metallography, earth science, forensic investigation, and materials quality control and research.
Thermo Fisher Scientific Inc. announced an affordable, yet sophisticated and easy-to-use X-ray detection platform, designed to enable food processors to meet the global demand for more thorough inspection for product contamination.
Rudolph Technologies, Inc. announced the release of the S3000SX™ thin film metrology system for transparent films in advanced semiconductor fabrication applications at the 28nm node and below.
Omega introduces its new series of pre-wired strain gages. Each gage for the KFH series has 50 mm of PTFE cable before transitioning to AWG 28 leads to prevent leads from adhering during installation.
The ATOS ScanBox 6130 is the newest addition to GOM’s product line of advanced automated solutions with the capability of scanning parts larger than 6.5 ft and/or up to 4,400 lbs in weight.
The heavy-duty Ashcroft Type 5503 differential pressure gage provides reliable low differential pressure measurement in high static, wet-wet media applications.
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