Articles by Dave Petrizze

Deep learning with vision-based CMM systems
Software

How AI is Addressing Vital Challenges Across the Metrology Value Chain

We’re just beginning to harness deep learning and AI to drive improvements in metrology and quality control, productivity, and competitiveness.
Dave Petrizze
October 28, 2024

In March 2023, after a GPT model passed a biology exam, Bill Gates noted on his blog that AI could save lives and address climate change. If AI can tackle such significant challenges, it can also help with issues faced by manufacturers, metrologists, and quality control professionals. This article will examine the challenges metrologists encounter and highlight potential AI-driven solutions in the metrology value chain.


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