Items Tagged with 'x-ray microscopy'

The push for smaller, more complex device components has spiked the need for precise, non-damaging metrology, with 3D X-ray microscopy (XRM) leading the way. This technology offers high-resolution measurements critical for quality control in the electronics and manufacturing industries.

Applications for industrial X-Ray CT—a 3D measurement technique that enables nondestructive inspection of an object’s internal and external features—are growing beyond the confines of the nondestructive testing (NDT) space that CT has occupied since the mid-1990s.