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Microelectronic Testing

April 28, 2008
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The MicroImpact testing system strikes a solder ball at a high rate of speed while simultaneously measuring force and displacement. The system is designed for R&D or process quality control of microelectronic devices. It has the ability to achieve shear speed from 0.2 meter per second to 1 meter per second using a patented low-inertia load transducer. The use of an LVDT is incorporated with the striker to collect the force and displacement data. This direct attachment of the load cell to the striker minimizes noise from the machine response. The company’s Impulse software is part of a complete instrumentation package for impact data acquisition and analysis. It includes a report editor for developing custom test report templates, more flexibility for Data Explorer and improved display of graphs and results tables.

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