The MSV-300 Series microspectroscopy system provides transmittance/reflectance measurements of microscopic sample sites for a range of wavelengths, from the ultraviolet to the near infrared. Conventional measurements require samples with dimensions comparable to a millimeter-sized optical beam. The series can measure color, film thickness and other spectral properties of a microscopic area for either large or small samples with a minimum spatial resolution of 30 microns. The optional automated X-Y-Z stage provides multi-point or mapping measurements for surface analysis of samples. The series has a spectral measurement range that offers continuous measurements between 250 and 2,000 nanometers (MSV-370). An integrated CCD camera allows verification of the analysis site and sample position while defining the sample aperture on the software system. All microscope operations are PC-controlled through the Spectra Manager software interface.