August 29, 2008
The TS 740 infrared touch probe offers machine tool operators the opportunity to perform measuring tasks that require a particularly high probing accuracy and repeatability. The probe technology involves the use of three sensor elements. When probing a workpiece, the stylus is deflected so that a force acts on these elements. This results in the generation of charges that are detected by the electronics and converted into trigger signals. Also, despite its low probing forces, the probe is suited for use in modern machine tools with a fast tool changer. Rapid acceleration or deceleration does not cause uncontrolled trigger signals.