Olympus Supports Surface Metrology Conference
CENTER VALLEY, PA-Worcester Polytechnic Institute (WPI), with support from Olympus America Inc., is hosting a three-day international conference on surface metrology October 26 to 28, 2009, at the WPICampusCenter in Worcester, MA. The conference will focus on the latest advances and insights in surface metrology fundamentals, methods, equipment, software and applications.
The International Conference on Surface Metrology is open to engineers, scientists, technicians and the general public interested in surface roughness and surface metrology applications. The program features extensive tutorials, exhibits and technical sessions addressing numerous technologies, industries and applications. In addition to engineering topics the conference includes technical presentations on surface metrology in archeology, anthropology and cultural preservation. There also will be poster sessions, an opening reception and a conference dinner for participants.
Olympus, provider of industrial microscopes and metrology systems, is supporting the conference with personnel and surface analysis instruments.
“The roughness of surfaces is among the most important and least understood areas of metrology,” says Matt Smith, director of sales and marketing for Olympus America’s Scientific Equipment Group-Industrial Microscopes business. “We are committed to advancing the field of metrology, and supporting the WPI conference is part of our commitment to education, scholarship and special programs for metrology professionals.”
For more information on the Worcester Polytechnic Institute International Conference on Surface Metrology, contact David Rideout at (484) 896-5792, [email protected] or visit www.olympusamerica.com/LEXT or http://surfacemetrology.org.
The International Conference on Surface Metrology is open to engineers, scientists, technicians and the general public interested in surface roughness and surface metrology applications. The program features extensive tutorials, exhibits and technical sessions addressing numerous technologies, industries and applications. In addition to engineering topics the conference includes technical presentations on surface metrology in archeology, anthropology and cultural preservation. There also will be poster sessions, an opening reception and a conference dinner for participants.
Olympus, provider of industrial microscopes and metrology systems, is supporting the conference with personnel and surface analysis instruments.
“The roughness of surfaces is among the most important and least understood areas of metrology,” says Matt Smith, director of sales and marketing for Olympus America’s Scientific Equipment Group-Industrial Microscopes business. “We are committed to advancing the field of metrology, and supporting the WPI conference is part of our commitment to education, scholarship and special programs for metrology professionals.”
For more information on the Worcester Polytechnic Institute International Conference on Surface Metrology, contact David Rideout at (484) 896-5792, [email protected] or visit www.olympusamerica.com/LEXT or http://surfacemetrology.org.
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