PALATINE, IL - Trace Laboratories Inc., a full-service, internationally accredited, independent testing organization, introduces a new certification and testing program for tin whisker growth on lead-free components. Tin whiskers can bridge conductive materials causing a costly and potentially dangerous short in circuits.
Trace’s new program complies with the RoHS (Restriction of the Use of Certain Hazardous Substances) Directive, incorporates the JEDEC Standard, JESD201: "Environmental Acceptance Requirements for Tin Whisker Susceptibility of Tin and Tin Alloy Surface Finishes," and includes the International Electronics Manufacturing Initiative (iNEMI) recommendations.
Trace’s tin whisker testing is a cost-competitive program consisting of three segments: two isothermal tests and one thermal cycling test. Trace will assemble, pre-condition (incorporating different re-flow profiles per standard), and conduct an initial screening inspection. The testing program typically consists of, at a minimum: 1) a high temperature/humidity aging test for 3,000 hours; 2) a storage test at ambient conditions for 3,000 hours; and a 3) rapid thermal cycle test for 1000 cycles. The program also includes tin-whisker inspection at the mid-point of each of these exposures to provide additional data on the tin-whisker growth characteristics of the test samples.
Trace inspects the product using SEM and SEM-certified stereomicroscopic equipment, providing detailed tin-whisker inspection at recommended intervals. The lab measures and records the total number of leads with tin-whiskers, the maximum whisker length, and whisker density. Comprehensive written test reports are provided and complete failure analysis is available.
Trace Introduces New Certification and Testing Program for Tin Whisker Growth
February 27, 2009