TUCSON, AZ-The Bruker Nano Surfaces division has been selected for an R&D 100 Award for AcuityXR enhanced-resolution microscopy technology. This novel optical surface profiler mode combines patent-pending hardware and software to enable select models of Bruker's ContourGT(R) 3-D Optical Microscopes to break the optical diffraction limit and deliver lateral resolutions that were previously considered impossible to achieve. Winners of the R&D 100 Awards are selected by an independent judging panel and the editors ofR&DMagazine as the 100 most technologically significant products introduced into the marketplace over the past year.

"Bruker is pleased to have again been recognized by the R&D 100 award committee," says Mark R. Munch, Ph.D., president of the Bruker Nano Surfaces division. "Prior to this year, instrumentation developed at our facilities has earned seven additional R&D 100 Awards, including four for optical metrology and three for atomic force microscopy. We are gratified that with AcuityXR we can provide our customers with previously unattainable optical metrology performance, and look very much forward to the innovations they will accomplish with these new capabilities."