The Fischerscope X-ray XDLM 237 accurately measures layer thickness on high end tools.  Also measures connectors, contacts, and coatings ideal for work in the electronic and semiconductor industries.  This instrument is fully automated with a programmable X and Y stage and Z -axis for precise measurements.  Allows metallic measurement of decomposition on tools before new coating is applied.FischerTechnology_IN

Fischer Technology, Inc.
(860) 683-0781