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Quality News

Sonoscan’s Steve Martell Wins IPC President’s Award

April 1, 2015

ELK GROVE VILLAGE, IL — Steve Martell, manager for advanced applications support at Sonoscan, received the IPC President's Award during the IPC APEX EXPO at the San Diego Convention Center on March 3.

Soon to celebrate his 30th year at Sonoscan, Martell was honored for his service to the electronics industry and to the IPC. His years among Sonoscan’s innovative engineers, alongside the world’s largest acoustic testing laboratory for components, let him make unique contributions to component and assembly standards, technology and education.

Over the years he has brought Sonoscan’s technological expertise to a number of IPC committees, and currently is a member of nine IPC committees that focus on the standards and applications for acoustic micro imaging of MEMS devices, silicon wafers, 3D ICs, HB-LED devices, plastic chip carrier cracking, counterfeit components and other areas. He is the chairman of two of these committees.

Because he deals with applications where Sonoscan’s C-SAM technology solves problems, Martell’s work covers the entire spectrum from the front end environment (wafers, ingots) to mid end (3D ICs) to back end (electronic components) to populated printed circuit boards.

In addition to serving as the liaison with organizations concerned with standards within the electronics industry, Martell is also responsible for Sonoscan’s applications support and especially for automated in-line Acoustic Micro Imaging Systems used in manufacturing.

For more information, visit www.sonoscan.com

KEYWORDS: silicon wafers

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