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Quality News

Attendee Registration Opens for the 2016 Coordinate Metrology Society Conference

February 4, 2016

Murfreesboro, TN—The Coordinate Metrology Society (CMS) announced its online attendee registration is open for the Coordinate Metrology Society Conference (CMSC). Held at a different location each year, the CMS will host this year's event at the Embassy Suites by Hilton in Murfreesboro, TN from July 25-29, 2016. The CMSC is known worldwide for its expert-level, original slate of technical papers and presentations covering measurement and inspection trends, successful applications and innovations in the metrology field, R&D, and industry best practices.

 

All papers are peer reviewed by the CMS Executive Board, and the top selections are published in the prestigious Journal of the CMSC. Registration is now open at https://www.cmsc.org/register. Interested Exhibitors will find conference details at https://www.cmsc.org/cmsc-exhibitor-information and should contact Exhibits Chair Gary Confalone at [email protected] for more information.

               

The 32nd annual CMSC is a week-long technology conference for users of portable 3D measurement solutions applied by manufacturers and science laboratories. The CMS will offer its proctored Level-One and Level-Two Certification examinations during the event.

 

Certification program guidelines and application forms are available on the CMS website at http://www.cmsc.org/cms-certification. For additional information on these career enhancement programs, contact Randy Gruver, Certification Chair, at [email protected]. Also during the week, the PrecisionPath Consortium for Large-scale Manufacturing will conduct a day-long working meeting led by the CMS and UNC Charlotte. Supported by an AMTech Grant from NIST, the industry-driven coalition is developing strategic roadmaps to solve universal technology challenges faced by manufacturers of large, high-precision parts and assemblies. For more information on this exciting initiative, contact Ron Hicks, CMS Committee Chair at [email protected]. 

               

CMSC attendees are metrologists, quality control professionals, manufacturing executives and managers, scientists, students, and educators looking to expand their knowledge of 3D portable measurement applications. The Coordinate Metrology Society takes its educational mandate seriously and delivers an extensive Measurement Zone and Education Zone in the Exhibition Hall. During the week, the CMS also presents metrology challenges, educational workshops, industry updates, a local tour and many networking opportunities. The action-packed CMSC Exhibition Hall will feature the latest in metrology products and services including industrial photogrammetry, laser trackers, laser radars, articulating arms, laser scanners, laser projection systems, indoor GPS, theodolites, inspection software, and accessories.

 

The CMSC Call for Papers continues until March 11, 2016. Abstract submissions are peer-reviewed by the Coordinate Metrology Society and considered for presentation at CMSC 2016. Notification of acceptance will occur on April 8, 2016. For guidelines or more information about presenting a technical paper, contact Scott Sandwith, Technical Presentations Coordinator at [email protected]. Guidelines for presentations and technical papers can be downloaded at 2016 CMSC Tech Paper Guidelines. Conference speakers gain recognition as industry experts, and all accepted white papers are peer reviewed and considered for publication in the Journal of the CMSC.  

KEYWORDS: CMMs CMSC coordinate measurement machine (CMM) metrology

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