Michigan Metrology, experts in solving problems related to surface texture, wear, finish and friction, will share their expertise in a two-day course, Apr 1-2, 2020 in Livonia, MI.

“This course is designed for scientists, engineers and technicians working in medical devices, automotive, aerospace, materials, polymers, and other fields,” said Don Cohen, PhD, who will lead the two-day workshop. “In recent years we have seen a great deal of interest in surface metrology and tribology education. This class offers material that will benefit both relative novices and advanced metrology users who want to further their understanding of these essential topics.”

The Surface Finish/Wear/Friction short course will cover:
• Measuring roughness, waviness and form
• Introduction to surface measurement instruments
• How to correctly set filters for texture measurements
• An overview of data analysis techniques and tools
• Definitions and applications of surface texture parameters
• Techniques for specifying surface texture
• Relating surface texture to wear, sealing, leaks and other functionality
• Surface energy, adhesion and texture, paint appearance
• The mechanics of dry sliding
• Characterizing rolling friction
• The fundamentals of lubrication.

In addition to classroom sessions, the workshop will include hands-on demonstrations with surface measurement and tribology instruments from Bruker Corporation. Attendees are encouraged to bring 1 – 2 samples to measure, in order to address their specific metrology and tribology requirements and challenges.

“Michigan Metrology has been hosting metrology classes for over 15 years,” said Dr. Cohen. “In that time, interest in the classes has grown dramatically. We continuously update topics and add examples that reflect the latest measurement technology and techniques. We’re anticipating a full house for the event and look forward to lively discussions and exchange of knowledge.”

For more information, visit www.michmet.com/classes.htm, call (866) 953-5030, or E-mail info@michmet.com.