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Home » Authors » David Wick

Articles by David Wick

roughness measurements

Choosing Sensors for your CMM

The goal of part inspection is to get results you can trust.
David Wick
July 1, 2019
One Comment

Sensors are an essential part of a metrology system, and there are several key factors that inform a buyer’s choice. These include ease of use, accuracy, speed and cost. Comparing the options can involve both analysis of features and actual demonstration of capabilities, but to get meaningful information for either you have to ask the right questions.


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Roughness and waviness inspected on a CMM. Source: ZEISS

High-Precision CMM and Form Measurement Functions

For a long time, these capabilities could not be effectively combined for several reasons.
David Wick
November 6, 2017
No Comments

It is generally agreed that engineering is about tradeoffs, and that has always been particularly true in regard to measurement machines. There are several types of measurement, and higher performance in one area generally meant less capability, or none, in other areas. 


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Measurement_FT

Sophisticated Metrology on a Budget

Buying the most economical system that meets your needs just makes sense, and finding that system need not be complicated.
David Wick
December 2, 2014
No Comments

There’s a place in the world for high-priced, top-of-the line systems, and there are applications for which nothing else will do.


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