Eric Felkel is the product manager for 3D optical profilers at ZYGO Corporation, based in Middlefield, CT. He has more than twenty years of experience in non-contact optical metrology instruments and technologies serving diverse markets and applications. His education includes a degree in optics from the University of Rochester, NY and an MBA from Norwich University in Northfield, VT.
The role of metrology is shifting. This is especially true in modern industrial settings and for increasingly exacting applications. Once perceived as a necessary evil residing in the quality control department validating the integrity of finished parts and components, today metrology is viewed more as an enabling technology that truly adds value.
