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Home » Keywords: » scanning electron microscopy (SEM)
Items Tagged with 'scanning electron microscopy (SEM)'
Electron backscattered diffraction (EBSD) is a technique for determining the near surface crystallographic and microstructural properties of a material.
Recent advances in scanning electron microscopy (SEM), particularly in the benchtop realm, enhance quality control procedures of laboratories across a wide range of industries.
The JSM-7600F is a thermal field emission (FEG) scanning electron microscope (SEM) that integrates a semi-in-lens objective lens with an in-lens thermal electron gun.