scanning electron microscopy (SEM)

Items Tagged with 'scanning electron microscopy (SEM)'

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Figure 1 - EBSD pattern quality maps for a duplex steel at low (left) and high (right) magnifications.

Using EBSD for Improved Quality Process in Metallurgy

Materials development, methods development and quality assurance benefit from the technique.

July 1, 2017

Electron backscattered diffraction (EBSD) is a technique for determining the near surface crystallographic and microstructural properties of a material.

NDT - Back 2 Basics

Advances in SEM Technology for the Quality Control Lab

A scanning electron microscope reveals information about changes in microscopic properties of particles.

Jeffrey D. McGinn

October 11, 2013

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Recent advances in scanning electron microscopy (SEM), particularly in the benchtop realm, enhance quality control procedures of laboratories across a wide range of industries.

Scanning Electron Microscope

January 28, 2009

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The JSM-7600F is a thermal field emission (FEG) scanning electron microscope (SEM) that integrates a semi-in-lens objective lens with an in-lens thermal electron gun.

Join this webinar to learn how companies of all sizes are adopting easy-to-use cobots to overcome the labor shortage, handle multi-shift operations, scale production on-the-fly, and solve many other challenges.

The Quality Show

The Quality Show is a 3-day tradeshow dedicated to connecting quality manufacturing professionals with process improvement vendors for all things QUALITY. Join thousands of quality managers, engineers and manufacturing professionals to network, attend education sessions and test out the latest technologies and products that will improve quality and productivity in your manufacturing process. We will be back in Rosemont, IL at the Donald E. Stephens Convention Center for the 5th biennial Quality Show, October 24-26, 2023. Look forward to seeing you there!

Items Tagged with 'scanning electron microscopy (SEM)'

ARTICLES

Using EBSD for Improved Quality Process in Metallurgy

Advances in SEM Technology for the Quality Control Lab

Scanning Electron Microscope

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