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Home » Keywords: » scanning electron microscopy (SEM)

Items Tagged with 'scanning electron microscopy (SEM)'

ARTICLES

Figure 1 - EBSD pattern quality maps for a duplex steel at low (left) and high (right) magnifications.

Using EBSD for Improved Quality Process in Metallurgy

Materials development, methods development and quality assurance benefit from the technique.
Chris Stephens Keith Thompson
July 1, 2017
One Comment

Electron backscattered diffraction (EBSD) is a technique for determining the near surface crystallographic and microstructural properties of a material. 


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SEM Tech ndt
NDT - Back 2 Basics

Advances in SEM Technology for the Quality Control Lab

A scanning electron microscope reveals information about changes in microscopic properties of particles.
Jeffrey D. McGinn
October 11, 2013
No Comments

Recent advances in scanning electron microscopy (SEM), particularly in the benchtop realm, enhance quality control procedures of laboratories across a wide range of industries.


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New_Products_FT

Scanning Electron Microscope

January 28, 2009
No Comments

The JSM-7600F is a thermal field emission (FEG) scanning electron microscope (SEM) that integrates a semi-in-lens objective lens with an in-lens thermal electron gun.


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