Items Tagged with 'silicon drift detectors (SDD)'

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XRF coating thickness measurement

With XRF Measurement, the Goal is Achieving Low Limits of Detection Precisely—and Fast

Here’s how to get there.
Jun Choi
June 8, 2018

X-ray fluorescence is an elemental analysis tool that has been a mainstay of test labs for decades. A versatile NDT method that demands only minimal sample prep and can be run by novice operators, it is perhaps most valued for delivering accurate results quickly. Today, evolving XRF capabilities are moving this quality assurance workhorse into critical new roles in a widening spectrum of industries.


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Choosing an X-Ray Fluorescence (XRF) Instrument

Energy Dispersive XRF systems are offered in a number of benchtop configurations and also in portable, handheld configurations.
Jim Bogert
April 9, 2015

XRF is a spectrometric technique that can be applied to many materials for composition analysis, as well as coating and multilayer thin-film thickness measurements.


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X-ray Sensitive Camera

January 30, 2009
The XR8800 Series X-ray line-scan camera family includes six models covering a range of active lengths, resolutions, speeds and sensitivity modes.
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