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Home » Authors » Jun Choi

Jun Choi

Jun Choi is the chief technology officer of Bowman (Schaumburg, IL). For more information, call (847) 781-3523 or email [email protected].

Articles

ARTICLES

This “bottom-up” XRF uses a motorized Z-axis with laser auto-focus.

XRF Analysis: What Labs and Lines Really Want—and New Features That Get Them There

Everyone’s ultimate goal: minimal variation, maximum speed.
Jun Choi
April 8, 2019

Innovations in the electronics and semiconductor industries have birthed two relentless trends. Both profoundly impact both product designers and those charged with assuring that what was designed is what was manufactured. The trends are: higher densities for components, boards and processors, and the need for very high precision in the metal plating that enables functionality.


Read More
XRF coating thickness measurement

With XRF Measurement, the Goal is Achieving Low Limits of Detection Precisely—and Fast

Here’s how to get there.
Jun Choi
June 8, 2018

X-ray fluorescence is an elemental analysis tool that has been a mainstay of test labs for decades. A versatile NDT method that demands only minimal sample prep and can be run by novice operators, it is perhaps most valued for delivering accurate results quickly. Today, evolving XRF capabilities are moving this quality assurance workhorse into critical new roles in a widening spectrum of industries.


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