Since SPM specialists Image Metrology and Digital Surf joined forces in 2014, development teams from both companies have been working hard to create the next generation of SPM image analysis software.
Semiconductor test equipment supplier Advantest and Digital Surf announced that PM3D Map software based on Digital Surf’s industry-standard Mountains Technology® is now incorporated into the company’s Multi Vision Metrology Scanning Electron Microscope (MVM-SEM®) series.
Bruker Corporation and Digital Surf announced that Bruker Nano Surfaces is offering Vision64 Mapdata analysis and reporting software with its entire line of 3D optical microscope systems.
The Scanning Electron Microscope (SEM) is widely used in various fields of industry and science because it is one of the most versatile imaging and measurement instruments. SEMs allow users to see details 1,000 times smaller than a conventional microscope.
