Industry News: 2008 Quality Measurement Conference Call for Papers
BENSENVILLE, IL-The Quality Measurement Conference will celebrate its 10th anniversary in 2008, with a focus on measurement issues and strategies, and a look at measurement in manufacturing environments.
BENSENVILLE, IL-The Quality Measurement Conference will celebrate its 10th anniversary in 2008, with a focus on measurement issues and strategies, and a look at measurement in manufacturing environments. The 2008 conference (formerly MMCW) will be held at the Marriott Suites Clearwater Beach on Sand Key, Clearwater, FL, April 28 through May 1, 2008.
The program is a two-day workshop featuring 50-minute paper presentations. In addition, there will be keynote and recurring speakers, along with suppliers who will present and showcase their products and services through tabletop exhibits. The conference seeks presentations and hands-on professional learning workshops about technology advancements, application case studies and operational management concepts related to the following:
Measurement in Manufacturing Environments:
In-line measurement/inspection
On-machine measurement
Cost savings through measurement
Increasing throughput
Thread gaging
Scrap reduction
ROI on measurement investments
Lean/Six Sigma applications
Quality measurement through the supply chain
Vision systems
Measurement Issues and Strategies:
Temperature control on measurements
Software compensation
Facility setup
Scanning CMMs
Laser scanning
Measurement “physics” and fundamentals
Training and operator capability
Standards
Training/development
GD&T
Information for Speakers:
Please provide a 150 to 200 word abstract by November 14, 2007.
After your abstract is reviewed, you will be required to submit a presentation for distribution to all registered attendees.
Papers should reflect the highest professional standard. The use of trade names and company advertising is prohibited. No sales presentations will be allowed.
Papers must be submitted in Microsoft Word, and presentations must be made in PowerPoint.
If your paper is chosen you will be asked to present in person at the Quality Measurement Conference 2008.
Important Deadlines:
Submission of abstracts: November 14, 2007
Notification of acceptance: January 4, 2008
Submission of completed paper: March 1, 2008
Submission of completed presentation: March 31, 2008
If you would like to be considered to present a paper at the Quality Measurement Conference 2008, register at www.qualitymag.com/qmc. For more information call Event Coordinator Dana Marsoupian at (248) 786-1584, e-mail [email protected] or visit www.qualitymag.com/qmc.
BENSENVILLE, IL-The Quality Measurement Conference will celebrate its 10th anniversary in 2008, with a focus on measurement issues and strategies, and a look at measurement in manufacturing environments. The 2008 conference (formerly MMCW) will be held at the Marriott Suites Clearwater Beach on Sand Key, Clearwater, FL, April 28 through May 1, 2008.
The program is a two-day workshop featuring 50-minute paper presentations. In addition, there will be keynote and recurring speakers, along with suppliers who will present and showcase their products and services through tabletop exhibits. The conference seeks presentations and hands-on professional learning workshops about technology advancements, application case studies and operational management concepts related to the following:
Measurement in Manufacturing Environments:
Measurement Issues and Strategies:
Information for Speakers:
Important Deadlines:
If you would like to be considered to present a paper at the Quality Measurement Conference 2008, register at www.qualitymag.com/qmc. For more information call Event Coordinator Dana Marsoupian at (248) 786-1584, e-mail [email protected] or visit www.qualitymag.com/qmc.
Looking for a reprint of this article?
From high-res PDFs to custom plaques, order your copy today!
