BENSENVILLE, IL-The Quality Measurement Conference will celebrate its 10th anniversary in 2008, with a focus on measurement issues and strategies, and a look at measurement in manufacturing environments.

BENSENVILLE, IL-The Quality Measurement Conference will celebrate its 10th anniversary in 2008, with a focus on measurement issues and strategies, and a look at measurement in manufacturing environments. The 2008 conference (formerly MMCW) will be held at the Marriott Suites Clearwater Beach on Sand Key, Clearwater, FL, April 28 through May 1, 2008.

The program is a two-day workshop featuring 50-minute paper presentations. In addition, there will be keynote and recurring speakers, along with suppliers who will present and showcase their products and services through tabletop exhibits. The conference seeks presentations and hands-on professional learning workshops about technology advancements, application case studies and operational management concepts related to the following:

Measurement in Manufacturing Environments:

In-line measurement/inspection

On-machine measurement

Cost savings through measurement

Increasing throughput

Thread gaging

Scrap reduction

ROI on measurement investments

Lean/Six Sigma applications

Quality measurement through the supply chain

Vision systems

Measurement Issues and Strategies:

Temperature control on measurements

Software compensation

Facility setup

Scanning CMMs

Laser scanning

Measurement “physics” and fundamentals

Training and operator capability

Standards

Training/development

GD&T

Information for Speakers:

Please provide a 150 to 200 word abstract by November 14, 2007.

After your abstract is reviewed, you will be required to submit a presentation for distribution to all registered attendees.

Papers should reflect the highest professional standard. The use of trade names and company advertising is prohibited. No sales presentations will be allowed.

Papers must be submitted in Microsoft Word, and presentations must be made in PowerPoint.

If your paper is chosen you will be asked to present in person at the Quality Measurement Conference 2008.

Important Deadlines:

Submission of abstracts: November 14, 2007

Notification of acceptance: January 4, 2008

Submission of completed paper: March 1, 2008

Submission of completed presentation: March 31, 2008


If you would like to be considered to present a paper at the Quality Measurement Conference 2008, register at www.qualitymag.com/qmc. For more information call Event Coordinator Dana Marsoupian at (248) 786-1584, e-mail marsoupiand@bnpmedia.com or visit www.qualitymag.com/qmc.