The conference will be held at the International Conference Centre Munich in conjunction with Laser World of Photonics.
SPIE Optical Metrology is the field’s premier conference in Europe for scientists, engineers, researchers, and applications or product developers, noted symposium chairs Wolfgang Osten, Universiteit Stuttgart; Malgorzata Kujawinska, Warsaw University of Technology; and Pietro Ferraro, Istituto Nazionale di Ottica Applicata.
Abstracts may be submitted through Nov. 15 for four conferences. They include:
Accepted papers will be published in the SPIE Digital Library as soon as approved after the meeting, and in print volumes and digital collections. The SPIE Digital Library is the world’s largest collection of optics and photonics literature and a leading resource for scientific and patent research.
Along with SPIE Optical Metrology, the biennial World of Photonics Congress includes conferences organized by the German Scientific Laser Society, European Optical Society, IEEE Photonics Society and the European Physical Society.
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