Olympus is pleased to announce the release of a new benchtop analyzer that combines X-ray Diffrac-tion (XRD) and X-ray Fluorescence (XRF) in one unit. The BTX Profiler carries on the revolutionary XRD technology employed in NASA’s “Curiosity” Rover, part of the successful NASA Mars Science Laboratory program, and the highly acclaimed, award winning earthbound technology employed in Olympus Analytical X-ray Instruments. The BTX Profiler combines these to provide compositional ma-terials analysis at the structural and elemental level affording economy of operational costs, space, and time with a seamless integration of data and results. 

The BTX Profiler reduces inefficiencies found in conventional powder diffraction systems. Its close-coupled transmission geometry allows for a low powered X-ray source and a small amount of sample. The sophisticated sample handling technology incorporates a patented vibration system that enables random crystal orientation in a fixed sample cell. The CCD detector with its “smart” energy discrimina-tion provides graphical 2-D diffraction patterns, or Ring Patterns, and acquires more data more quickly than conventional XRD detectors.