Items Tagged with 'acoustic microscope'

In this paper, we introduce a newly developed semi-analytical model to predict the total focusing method (TFM) amplitude sensitivity map for both nondirectional and directional flaws.

An electronic component on its way to being installed in a system has, it is hoped, no cracks, voids or other internal structural defects that may cause an electrical failure in service. 

Sonoscan® has introduced the J610™, the latest member of its C-SAM® acoustic microscope line.  The J610 is a semi-automated tool designed for production environments and has an unusually large scan area. Its key role is finding internal structural defects by screening trays of loose components, wafers, board-mounted components and other suitably sized items.