Calibration is an essential component of the manufacturing process, especially as demand for Industry 4.0 technologies grows. Such tools require accurate data. 

The linchpin of automation—since before it was even referred to as such—is in its obvious benefits in increased efficiency and accuracy and its ultimate reduction in cost, time and waste. 

A Nikon Metrology XT H 225 ST computed tomography imaging system at the University of Arkansas is enabling non-destructive, 2D and 3D study of the inside as well as the outside of a wide variety of objects. Download the white paper to read more.

Those of us on the march towards Quality 4.0 in our manufacturing companies are grappling with the challenge of producing high quality parts with a minimal investment of time and resources into new inspection methodologies. 

The latest generation of scanCONTROL 30xx laser scanners is extremely powerful, precise and individually adaptable.  

Every business or service today has some form of quality control or quality assurance. With such high market competition, quality has become the market differentiator for almost all products and services.

Mitutoyo America Corporation announces the release of the new M2 2D Processor as part of a new package with the PH-3515 Profile Projector. The M2 2D processor updates the PH-3515 Profile Projector with a new touch screen tablet and easier 2D processing for measuring dimensions.

Surface finish affects how a part will fit, reflect light, transmit heat, wear, distribute lubrication, accept coatings and more. The right finish should ultimately be determined by the part’s function and the engineering requirements of the application.

For over a decade, 2D digital radiography (DR) has been aggressively replacing film radiography in applications spanning across most industries. DR image quality continues to improve with higher quality and faster speed flat panel detectors being offered.

3D builds on the proven capabilities of 2D by adding a secondary layer of data describing shape, which is essential to designing highly robust measurement systems.