TOKYO, Japan and BESANÇON, France — JEOL and Digital Surf, creator of Mountains surface and image analysis technology, announced the release of Smile View Map software for users of JEOL’s scanning electron microscope (SEM) systems.
This new release is geared towards engineers working in a wide range of application areas including nanotechnology, metals, semiconductors, ceramics, medicine and biology.
Smile View Map gives users access to a set of features for visualizing, analyzing and reporting their data.
Smile View Map is a tool for SEM data imaging, analysis and metrology.
For more information, visit www.jeol.co.jp/en/.
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