JAI announced the expansion of its Wave Series with the introduction of two new high-performance SWIR line scan cameras: the WAL-1001-GE (1K) and WAL-2001-GE (2K). Designed for demanding industrial inspection applications, the new models combine high-sensitivity short-wave infrared imaging with a GigE Vision interface, enabling efficient data transfer and straightforward system integration.

The new cameras are engineered to deliver reliable imaging performance in challenging conditions where conventional imaging falls short. With large 12.5 µm × 12.5 µm pixels, both models provide a high signal-to-noise ratio and excellent infrared response, ensuring precise detail capture even in low-light environments. A peak quantum efficiency of up to 83% further enhances sensitivity, supporting high-speed imaging without compromising image quality.

Both cameras offer flexible Mono 8-, 10-, 12-, and 14-bit output, enabling accurate intensity representation, smoother grayscale transitions, and improved measurement precision in demanding SWIR inspection tasks.

The WAL-1001-GE features a 1 × 1024-pixel sensor with a 12.8 mm sensor width, combined with large 12.5 µm square pixels, a GigE Vision interface, and a standard C-mount. Supporting line rates of up to 29 kHz (29,000 lines per second), it delivers an optimal balance of sensitivity, image quality, and throughput for a wide range of inspection systems.

The WAL-2001-GE builds on this performance with a 2K resolution output and line rates of up to 40 kHz (40,000 lines per second), enabling higher-speed inspection applications.

The camera utilizes a dual-line architecture (2 × 1024 pixels) with a 0.5-pixel offset, effectively increasing sampling density. Combined with operation at double the line rate, this results in an equivalent pixel size of 6.25 µm × 6.25 µm and nearly doubles the resolution compared to conventional 1K line scan cameras. This design enables reliable detection of sub-pixel-scale defects.

Image synthesis is performed in real time within the camera, eliminating the need for external acquisition hardware. This simplifies system architecture, reduces latency, and allows seamless upgrades from 1K to 2K resolution without changes to optics, lighting, or working distance.

The new Wave Series SWIR line scan cameras provide high-performance imaging for a wide range of machine vision applications, including:

•    Food sorting and grading, enabling moisture and contamination detection, foreign material inspection, and quality assessment based on bruising, ripeness, or early mold development.

•    Semiconductor wafer inspection, supporting detection of subsurface cracks, surface uniformity analysis, edge inspection, and alignment through silicon.

•    Recycling and material sorting, enabling reliable identification and separation of plastics such as PET, PE, PP, and PS, including black and dark materials.

•    Pharmaceutical and fill-level inspection, supporting high-speed inspection of vials, ampoules, and blister packaging with reliable fill verification. 

•    Plastic seal inspection, enabling reliable detection of seal defects such as bubbles, wrinkles, and improper sealing in transparent or opaque packaging systems

With a 12.8 mm sensor width, both models support standard C-mount optics, offering flexibility in lens selection and straightforward integration into existing systems. As with all JAI cameras, the new models are built using advanced low-noise designs and high-quality components, and undergo extensive thermal, shock, and vibration testing to ensure long-term reliability in industrial environments.

With the introduction of the WAL-1001-GE and WAL-2001-GE, JAI continues to expand its Wave Series portfolio, delivering flexible, high-performance SWIR imaging solutions tailored to the evolving needs of industrial vision applications.

In addition, the Wave Series will soon be extended with a new SWIR area scan camera offering 1.3 MP resolution, further broadening application possibilities.

JAI
https://news.jai.com/introducing-new-wave-series-swir-line-scan-cameras-with-1k-and-2k-resolution-and-gige-vision-interface
www.jai.com