JAI announced the expansion of its Wave Series with the introduction of the Wave WAA-1300-GE-TEC, a new single-sensor area scan camera that combines visible and short-wave infrared (SWIR) imaging capabilities in one solution.

Built around an advanced InGaAs image sensor with sensitivity ranging from 400 nm to approximately 1700 nm, the Wave WAA-1300-GE-TEC responds to both visible and SWIR wavelengths within a single sensor. This enables machine vision systems to detect material characteristics and features that may not be visible using conventional imaging technologies, while reducing the complexity typically associated with multi-camera solutions.

The new camera delivers 1.3-megapixel resolution with a 1280 × 1024 sensor format, 5 μm square pixels, and frame rates of up to 90 frames per second. It is equipped with a GigE Vision interface for straightforward integration into industrial vision systems and features a C-mount lens mount for flexible optical configuration.

By capturing visible and SWIR information with one sensor, the Wave WAA-1300-GE-TEC supports more reliable defect detection, material classification, and quality inspection across a wide range of machine vision applications. It can also help simplify system integration by reducing the need for multiple cameras, image registration, and additional processing steps.

To support stable image quality, the camera incorporates integrated ThermoElectric Cooling (TEC), which actively regulates sensor temperature during operation. By reducing sensor temperature, TEC helps lower dark noise and improve image quality and dynamic range. At the same time, maintaining a stable operating temperature helps preserve calibration accuracy and image consistency under changing environmental conditions, which is particularly important in SWIR imaging applications.

The camera’s broad wavelength sensitivity makes it suitable for industrial inspection, measurement, and sorting applications including fruit and vegetable sorting and grading, semiconductor alignment, plastic seal inspection, laser beam profiling, and recycling and material sorting.

JAI
www.jai.com