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Home » Authors » Mike Zecchino

Mike Zecchino

Mike Zecchino has been creating technical content and resources related to metrology and measurement for over 20 years. His articles have appeared in dozens of publications, and his training materials and videos support numerous measurement instruments and technologies.  He can be reached at [email protected]

Articles

ARTICLES

Figure 1 hemisphere standard
Measurement

Beyond Calibration: What a Calibration Sticker May (And May Not) Tell You

While calibration has been with us as long as gages, the concept of a third party performing regular calibrations is relatively recent.
Mark Cobb Jeff Dax Mike Zecchino
August 30, 2025

Gages need calibration, but an annual calibration sticker can mislead non-experts. In addition to regular calibration, proper maintenance, operation, and frequent result verification are crucial. The best practices outlined in this article will help ensure reliable measurements during and between calibrations.


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Hand holding material in front of laptop showing surface texture data.
Measurement

Surface Texture Metrology Matures

Visualization tools can improve how engineers understand part surfaces.
Mark Malburg Mike Zecchino
May 13, 2025

Quality assessments of parts often rely on a "yes" or "no" on a printed report, a "good" part versus "bad." However, advancements like 3D scanning allow engineers to visualize and analyze surface textures, revealing crucial insights beyond basic roughness values, which is vital for meeting increasing performance demands.


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Cover image of wear test sample with dime, Michigan Metrology.
Measurement

3D Optical Profiling Breaks the Speed Limit

Today 3D optical profiling can provide an ever-growing range of measurements in medical devices, semiconductors, automotive production, aerospace, materials, machining, and more.
Donald K. Cohen Ph.D. Mike Zecchino
August 15, 2024

3D optical profiling, developed in the early 1990s, is crucial for high-resolution measurement of optics, semiconductors, medical devices, and precision machining. Recent developments have expanded its capabilities, allowing high-resolution surface texture measurements over many square millimeters in minutes.


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Software C FEATURE Figure 5 FT software for remote oversight digital metrology
Software

Software helps see inside a lights out process

Remote oversight supports processes that cannot by nature be closed loop controlled.
Mike Zecchino
December 31, 2023

An Industry 4.0 mindset and a “lights-out” style of operation is driving quality and manufacturing teams to integrate measurements and process controls more tightly. The hope is that localized, closed loops will provide great benefits, including lower manufacturing costs, lower labor costs, and improved product quality.


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QM0521-FT-Measurement-p1FT-digital_metrology-1170x878.jpg

GD&T’s New Rule and What it means for Measurement

Here we will explore the implications of rule "S" and the limits/requirements of today's metrology as it is applied to these GD&T requirements.
Mark Malburg AJ Mennuti Mike Zecchino
May 6, 2021

In Geometric Dimensioning and Tolerancing (GD&T) there has been a long-standing conflict between the worlds of specification and measurement. The goal of specification is to ensure that components will function; the goal of measurement is to ensure that manufactured components meet those functional requirements. 


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engine block

Hidden Waviness: When Measuring Roughness Cannot Solve Quality Challenges

Roughness and waviness are dictated by each particular application.
Donald K. Cohen Ph.D. Mark Malburg Mike Zecchino
June 1, 2020

Specifications for surface texture frequently focus on surface “roughness”—the finer structures in the texture—often to the exclusion of the “waviness”—the larger structure of the texture. Unfortunately, problems related to sealing, vibration, noise, wear, etc., are regularly caused by issues hidden in the waviness domain, which cannot be captured by common roughness specifications.


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