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Home » Authors » Mike Zecchino

Mike Zecchino

Mike Zecchino has been creating technical content and resources related to metrology and measurement for over 20 years. His articles have appeared in dozens of publications, and his training materials and videos support numerous measurement instruments and technologies.  He can be reached at mzecchino@digitalmetrology.com

Articles

ARTICLES

QM0521-FT-Measurement-p1FT-digital_metrology-1170x878.jpg

GD&T’s New Rule and What it means for Measurement

Here we will explore the implications of rule "S" and the limits/requirements of today's metrology as it is applied to these GD&T requirements.
Mark Malburg Mike Zecchino AJ Mennuti
May 6, 2021
14 Comments

In Geometric Dimensioning and Tolerancing (GD&T) there has been a long-standing conflict between the worlds of specification and measurement. The goal of specification is to ensure that components will function; the goal of measurement is to ensure that manufactured components meet those functional requirements. 


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engine block

Hidden Waviness: When Measuring Roughness Cannot Solve Quality Challenges

Roughness and waviness are dictated by each particular application.
Mike Zecchino Mark Malburg Donald K. Cohen Ph.D.
June 1, 2020
32 Comments

Specifications for surface texture frequently focus on surface “roughness”—the finer structures in the texture—often to the exclusion of the “waviness”—the larger structure of the texture. Unfortunately, problems related to sealing, vibration, noise, wear, etc., are regularly caused by issues hidden in the waviness domain, which cannot be captured by common roughness specifications.


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