The ARL 9900 Series X-ray workstation combines full X-ray Diffraction (XRD) and X-ray Fluorescence (XRF) into a single instrument. With the instrument it is possible to perform a complete elemental (chemical) analysis and determine the mineral or structural composition on the same sample under vacuum. Elemental/oxide analysis can be accomplished by a series of XRF monochromators for high throughput, by an XRF goniometer for flexibility or a combination of both. Full pattern phase analysis can be achieved on the same sample by the XRD goniometer using the company’s OXSAS software. Fully automated control analysis of any unknown material is accomplished by standard-less programs both in XRF and XRD. In addition, the chemical data from XRF can be used for processing the XRD data or vice versa.