ZEISS Industrial Quality Solutions is presenting a hero's journey at the 2024 International Manufacturing Technology Show (IMTS) booth #134302 in the East Hall, Level 3. This interactive experience allows visitors to learn about the ZEISS superforce of precision quality technologies and software and its team of experts. Throughout their journey, visitors will answer quick questions and gain insight into technologies that support quality across the entire product lifecycle while winning prizes.

The ZEISS Industrial Quality Solutions portfolio will be on display throughout the 5,200 square foot booth, including automation, CMMs, CT/X-ray NDT, industrial microscopes, optical 3D scanners, VMMs, surface and special geometry instruments, and intelligent software solutions for the aerospace, automotive/NEV, medical, electronics, and power and energy industries. New technology debuting at IMTS includes the new VMM microscope ZEISS O-INSPECT duo, the new generation of the ZEISS PRISMO fortis high-speed CMM, the new compact CMM for large volume parts ZEISS MMZ 1 table, and the latest edition of CALYPSO software. Booth visitors will also be able to take advantage of more than a dozen exclusive show specials on both technology and software solutions.

In addition to winning prizes throughout their hero journey, visitors will also get to compete for the fastest time on the leaderboard in a challenging metrology matching game. The software play station offers the opportunity to explore the complete ZEISS quality and data management software solutions portfolio and its powerful, industry-focused features. Meanwhile, the hospitality area will serve fresh coffee for visitors to relax and enjoy.

Smartforce Student Summit, East Building Level 2

At the ZEISS Academic booth #121401, visitors can learn about the ZEISS Academic Program which supports colleges and universities with metrology and inspection technology installations across the USA and Canada. Teachers and students can test drive ZEISS technology at the booth and meet with ZEISS experts to learn how ZEISS can support metrology education in their institution.

IMTS Conference Session, West Building - W193-A

"Achieving Digitalization through Data Diversity" presented by Scott Lowen, Software Product Manager and Ian Scribner, Product Sales Manager at ZEISS on Thursday, September 12, from 3:15 PM - 4:10 PM Central.

This session focuses on achieving digitalization for continuous process improvement across the product lifecycle by applying a connected and efficient approach to data acquisition and analysis. Attendees learn how to strategically select the optimal metrology technology to collect accurate data to feed into digital twin and digital transformation initiatives efficiently. 

For more information, visit www.zeiss.com/metrology.