Articles Tagged with ''metrology''

The 13th Annual ASSEMBLY Show wrapped up at the Donald E. Stephens Convention Center in Rosemont, IL. The winners of the New Products Award were announced.

Mitsubishi Electric Automation, Inc. (Mitsubishi Electric Automation) has announced the release of its Integrated Machine Analytics (IMA) C70 Adapter, a cutting-edge solution designed to empower manufacturers with real-time visibility into critical machine data.

GrayMatter Robotics has received a Small Business Innovation Research (SBIR) Direct to Phase II (D2P2) contract from AFWERX, the innovation arm of the Department of the Air Force.

Balancing technology significantly enhances the safety and efficiency of aerospace systems and machines. Properly balanced components reduce vibration, extend equipment life, and improve efficiency, evolving from manual processes to digital systems with real-time monitoring.

Successful Lean Six Sigma (LSS) deployment requires management leadership. Trained as LSS Champions, leaders sponsor and oversee projects, aligning them with strategic objectives and allocating resources.

FARO®, a business unit of AMETEK®, Inc., announced the addition of the HandySCAN BLACK™|Elite as the first initiative under its recent strategic partnership with Creaform.

Shipments of cutting tools, measured by the Cutting Tool Market Report, a collaboration between AMT – The Association For Manufacturing Technology and the U.S. Cutting Tool Institute (USCTI), totaled $210.6 million in August 2025.

Explaining control charts is difficult due to the unappealing terminology in quality management. Terms like “control charts” and “Statistical Process Control” can deter understanding. Alternative names like “process behavior charts” haven't improved appeal either. Given the popularity of user-friendly tracking on smart devices, there’s a need to rebrand these tools to make them more accessible and engaging.

Technology companies in automotive and aerospace are revolutionizing engineering with Model-Based Definition (MBD), which makes 3D CAD models the primary source for product details, integrating dimensions and tolerances directly.

This article emphasizes the need for efficient wafer inspection in semiconductor manufacturing to maximize throughput and minimize defects. It highlights that modern methods must combine speed with sensitive defect detection, with advanced machine vision technology being crucial for identifying macro defects early in the production process to avoid costly issues in finished components.