Articles Tagged with ''lighting''

This is the fifth and final article in the series on lighting design for machine vision.

This is the fourth article of a five-article series on lighting design for machine vision.

This is the third article in the five-article series on lighting design for machine vision.

Lighting is arguably one of the most critical factors in the optical inspection tasks using modern 4K digital microscopes. 

Every second counts on high-speed conveyor lines. A missed barcode or a tiny defect can disrupt production, increase costs, and reduce quality.

You could argue that glare is the very reason that machine vision lighting exists. Whether detecting a faint scratch on a glossy surface or decoding an etched code on metal, unwanted reflections can obscure details and compromise inspection accuracy.

This is the second article in a five-article series on machine vision. 

This is the first of five articles to help you design lighting for machine vision.

This article emphasizes the need for efficient wafer inspection in semiconductor manufacturing to maximize throughput and minimize defects. It highlights that modern methods must combine speed with sensitive defect detection, with advanced machine vision technology being crucial for identifying macro defects early in the production process to avoid costly issues in finished components.

CCS Inc. announced that its group entities, CCS Europe and EFFILUX, jointly opened a Light Lab while relocating its German office.